Scope of the Conference

  • Josephson Effect and Quantum Voltage Standard
  • Quantum Hall Effect and Electric Resistance Standard
  • Atomic Standards of Frequency
  • Single Electron Tunneling
  • Spintronics
  • Scanning Microscopy and its Applications in Metrology
  • Nuclear Magnetic Resonance
  • Applications of SQUIDs
  • Nanometrology
  • Measurement Systems for Quantum Metrology
  • Cryoelectronics
  • Quantum Entanglement Sensing, Imaging & Metrology
  • Fundamental Physical Constants for Metrology
  • The Quantum SI - the New System of Units